RTS Noise Characterization in Single Photon Avalanche Diodes

Publication: RTS Noise Characterization in Single Photon Avalanche Diodes

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Title:	RTS Noise Characterization in Single Photon Avalanche Diodes
Authors:	M.A. Karami, E. Charbon
Institutes:	EPFL
Journal/Conference:	Electron Device Letters, Vol. 31, N.7, pp. 692-694, 2010/01/01
Description:	RTS Noise Characterization in Single Photon Avalanche Diodes
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Publication Type:	Peer reviewed publication
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