A Low-Noise Single-Photon Detector Implemented in a 130 nm CMOS Imaging Process; Solid-State Electronics

From SwissExperiment

Publication: A Low-Noise Single-Photon Detector Implemented in a 130 nm CMOS Imaging Process; Solid-State Electronics

Edit:	Edit this page using the form
Title:	A Low-Noise Single-Photon Detector Implemented in a 130 nm CMOS Imaging Process; Solid-State Electronics
Authors:	M. Gersbach, J. Richardson, E. Mazaleyrat, S. Hardillier, C. Niklass, R. Henderson, L. Grant, E. Charbon
Institutes:	EPFL
Journal/Conference:	Solid-State Electronics, Vol. 53, N. 7, pp. 803-808, 2009/07
Description:	A Low-Noise Single-Photon Detector Implemented in a 130 nm CMOS Imaging Process; Solid-State Electronics
Link:
Publication Type:	Peer reviewed publication
Deployment/Facility
Experiment(s)